Christian Kottler

Title: Christian Kottler: Innovator in X-ray Interferometry

Introduction

Christian Kottler is a notable inventor based in Zurich, Switzerland. He has made significant contributions to the field of X-ray interferometry, holding 2 patents that showcase his innovative approach to imaging technology.

Latest Patents

Kottler's latest patents include an X-ray interferometer designed for imaging objects. This invention features a phase grating that induces a phase shift in the X-ray incident on it, along with an absorption grating that affects the absorption of the X-ray. The design allows for a detector to be placed at a considerable distance from the absorption grating, ensuring that the phase contrast sensitivity of the image remains largely unaffected. Another patent involves an interferometer device and method that includes an electromagnetic radiation source, phase grating, absorption grating, and a detector, all radiatively coupled. This device is engineered to produce a phase shift smaller than π on the emitted radiation.

Career Highlights

Throughout his career, Kottler has worked with esteemed organizations such as CSEM Centre Suisse d'Electronique et de Microtechnique SA. His work at CSEM has been pivotal in advancing microtechnology and electronics.

Collaborations

Kottler has collaborated with notable professionals in his field, including Rolf Kaufmann and Vincent Revol. These partnerships have contributed to the development and refinement of his innovative technologies.

Conclusion

Christian Kottler stands out as a significant figure in the realm of X-ray interferometry, with his patents reflecting a deep understanding of imaging technology. His contributions continue to influence advancements in the field.