The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2011

Filed:

Nov. 12, 2008
Applicants:

Christian Kottler, Zurich, CH;

Rolf Kaufmann, Zurich, CH;

Inventors:

Christian Kottler, Zurich, CH;

Rolf Kaufmann, Zurich, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03H 5/00 (2006.01); G01T 1/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses an interferometer device and method. In embodiments, the device comprises an electromagnetic radiation source emitting radiation having a first mean wavelength λ; a phase grating having a first aspect ratio; an absorption grating having a second aspect ratio; and a detector. The electromagnetic radiation source, the phase grating, the absorption grating and the detector are radiatively coupled with each other. The absorption grating is positioned between the detector and the phase grating; the electromagnetic radiation source is positioned in front of the source grating; and wherein the phase grating is designed such to cause a phase shift that is smaller than π on the emitted radiation. Additional and alternative embodiments are specified and claimed.


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