Christiaan H Velzel

Title: Christiaan H Velzel: Innovator in Optical Measurement Technologies

Introduction

Christiaan H Velzel is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of optical measurement technologies, holding a total of 9 patents. His work focuses on methods and devices that enhance the precision of optical measurements.

Latest Patents

Among his latest patents, Velzel has developed a method and interference microscope designed for microscoping objects. One of his key innovations is an optical height detector that utilizes coaxial irradiation and image axes. This technology determines the height of a surface by measuring the axial position of an irradiated spot formed on the surface. The process involves collecting radiation reflected by the surface through a lens, which forms an image spot on the axis. The position of this image spot is determined by measuring the intensity of the radiation at multiple positions along the axis using a detection unit. The output signals from this unit are processed electronically to ascertain the position of the highest radiation intensity, thereby providing a signal that represents the axial position of the image spot.

Career Highlights

Velzel has had a distinguished career, including his tenure at U.S. Philips Corporation, where he contributed to various innovative projects. His expertise in optical technologies has positioned him as a key figure in the industry.

Collaborations

Throughout his career, Velzel has collaborated with notable professionals, including Henricus M Kessels and Peter Ferdinand Greve. These collaborations have further enriched his work and expanded the impact of his inventions.

Conclusion

Christiaan H Velzel's contributions to optical measurement technologies exemplify his innovative spirit and dedication to advancing the field. His patents and collaborations reflect a commitment to precision and excellence in optical engineering.