The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 1989

Filed:

Dec. 08, 1986
Applicant:
Inventors:

Henricus M Kessels, Eindhoven, NL;

Christiaan H Velzel, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 45 ; 369109 ; 369122 ; 350-371 ; 2502 / ;
Abstract

Apparatus for scanning the information surface of an optical disc record carrier with a radiation beam. Errors in beam focus on such surface are detected by providing two optical gratings in succession in the path of the radiation reflected from the record carrier. The gratings have a constant grating period, which may be equal or in a fixed ratio, the directions of the grating strips of the two gratings intersecting each other at a relatively small angle, thereby forming a Moire interference pattern in the radiation emergent from the two gratings which rotates due to changes in beam focus. This changes the relative amounts of radiation received by an assembly of radiation detecting elements adjacent the second grating, producing a focus error control signal which can be employed for correcting beam focus.


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