Christiaan Baert

Title: Christiaan Baert: Innovator in Infrared Radiation Detection

Introduction

Christiaan Baert is a notable inventor based in Heverlee, Belgium. He has made significant contributions to the field of infrared radiation detection, holding a total of five patents. His work focuses on the development of electronic devices that enhance the detection of infrared radiation.

Latest Patents

Among his latest patents is an innovative infrared radiation detector. This electronic device includes a substrate and a transistor integrated within it, along with a silicon-germanium (Si-Ge) structural layer that is coupled with the transistor. The structural layer is designed to maintain a stress within a predetermined range, which is selected prior to its deposition. This careful selection ensures that the deposition process does not adversely affect the operation of the transistor. Another significant patent involves a method of fabricating an infrared radiation detector. This method controls the internal stress in a polycrystalline silicon-germanium layer deposited on a substrate by selecting specific deposition pressures and temperatures.

Career Highlights

Christiaan Baert has worked with the Interuniversitair Microelektronica Centrum (imec), a leading research institution in microelectronics. His experience at imec has allowed him to contribute to cutting-edge research and development in the field of electronic devices.

Collaborations

Throughout his career, Baert has collaborated with esteemed colleagues such as Paolo Fiorini and Sherif Sedky. These collaborations have further enriched his work and contributed to advancements in infrared detection technologies.

Conclusion

Christiaan Baert's innovative work in infrared radiation detection exemplifies the impact of dedicated inventors in advancing technology. His patents and collaborations highlight his commitment to enhancing electronic device functionality.