Chris Day

Title: Chris Day - Innovator in Semiconductor Testing

Introduction

Chris Day is a notable inventor based in Mountain View, CA. He has made significant contributions to the field of semiconductor testing, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

One of Chris Day's latest patents is titled "Method and apparatus for testing of semiconductor devices." This invention provides a computer-based method for determining whether a semiconductor device conforms to design requirements. The method utilizes data stored in a design database and an automatic test equipment (ATE) datalog. It includes generating a requirements datalog responsive to the design database, generating a standard datalog responsive to the ATE datalog, and producing a conformance indication based on these datalogs.

Another significant patent is "Process for predicting propagation delay using linear interpolation." This process is designed for use with ATE to determine propagation delay in a semiconductor circuit. It involves determining an expected delay time by interpolating various capacitances and comparing the ATE delay time with the expected delay time to assess whether the propagation delay is acceptable.

Career Highlights

Chris Day has built a successful career at LSI Logic Corporation, where he has applied his expertise in semiconductor technology. His work has been instrumental in advancing testing methodologies that enhance the reliability and performance of semiconductor devices.

Collaborations

Chris has collaborated with various professionals in the field, including his coworker Nicholas Sporck. Their combined efforts have contributed to the development of innovative solutions in semiconductor testing.

Conclusion

Chris Day is a prominent inventor whose work in semiconductor testing has led to valuable patents that improve industry standards. His contributions continue to influence the field and drive technological advancements.