The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 1997

Filed:

Oct. 20, 1995
Applicant:
Inventor:

Chris Day, Mt. View, CA (US);

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364580 ; 364488 ; 364490 ; 364579 ; 395919 ; 395920 ; 371 226 ; 371 271 ;
Abstract

A computer-based method is provided for determining whether a semi-conductor device conforms to design requirements. In one embodiment, the method is based on data stored in a design database, and an automatic test equipment ('ATE') datalog. In a further embodiment, the method includes generating a requirements datalog responsive to the design database, generating a standard datalog responsive to the automatic test equipment datalog, and generating a conformance indication responsive to the requirements datalog and the standard datalog.


Find Patent Forward Citations

Day, Chris. (1997). Method and apparatus for testing of semiconductor devices (U.S. Patent No. 5668745). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5668745

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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