Tianjin, China

Chiu-Yue Duan

This inventor holds 1 USPTO granted patent. Top assignee: Inventec Corp.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chiu-Yue Duan. Retrieved from https://idiyas.com/inventor/chiu-yue-duan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2008

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations by Chiu-Yue Duan

Introduction

Chiu-Yue Duan is a notable inventor based in Tianjin, China. He has made significant contributions to the field of printer technology. His innovative approach has led to the development of a unique testing method for printers.

Latest Patents

Chiu-Yue Duan holds a patent for a "Testing method for extended capabilities port of printers and fixture thereof." This method involves connecting D-D with four status signal pins, D-D to the control signal pins, and the remaining status signal pins to one of the four connected status pins. The working conditions of data transmission for the data signal pins (D-D), status signal pins (ERROR, ACK, BUSY, PE, SLCT), and control signal pins (STROBE, AUTOFD, INT, SCLTIN) are thoroughly tested.

Career Highlights

Chiu-Yue Duan is associated with Inventec Corporation, where he applies his expertise in printer technology. His work has been instrumental in enhancing the functionality and reliability of printers.

Collaborations

Chiu-Yue Duan has collaborated with notable colleagues such as Win-Harn Liu and Jeff Song. Their combined efforts have contributed to advancements in the field of printing technology.

Conclusion

Chiu-Yue Duan's innovative contributions to printer technology demonstrate his commitment to improving the industry. His patent and collaborations highlight his role as a significant inventor in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…