The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7315392 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 01, 2008

Filed:

Apr. 23, 2003
Applicants:

Win-harn Liu, Taipei, TW;

Jeff Song, Taipei, TW;

Zhen Wang, Tianjin, CN;

Chiu-yue Duan, Tianjin, CN;

Inventors:

Win-Harn Liu, Taipei, TW;

Jeff Song, Taipei, TW;

Zhen Wang, Tianjin, CN;

Chiu-Yue Duan, Tianjin, CN;

Assignee:

Inventec Corporation, Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06K 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of testing the extended capabilities port of printers involves connecting D˜Dwith 4 status signal pins, D˜Dto the control signal pins, and the rest of the status signal pins to one of the four connected status pins. The working conditions of data transmission of the data signal pins (D˜D), the status signal pins (ERROR, ACK, BUSY, PE, SLCT), and the control signal pins (STROBE, AUTOFD, INT, SCLTIN) are then tested.


Find Patent Forward Citations

Liu, Win-Harn. (2008). Testing method for extended capabilities port of printers and fixture thereof (U.S. Patent No. 7315392). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7315392

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