This inventor holds 1 USPTO granted patent. Top assignee: National Science Council of R.o.c.. Active years: 1996.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1996
Title: Ching-Hong Tsai: Innovator in Boundary Scan Technology
Introduction
Ching-Hong Tsai is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of electronic testing through his innovative patent. His work focuses on enhancing the capabilities of boundary scan circuits, which are essential for built-in self-testing in electronic devices.
Latest Patents
Ching-Hong Tsai holds a patent for the "IEEE Std. 1149.1 boundary scan circuit capable of built-in self-testing." This invention includes a logic circuit, cascaded input boundary-scan cells forming an input boundary-scan register, and cascaded output boundary-scan cells forming an output boundary-scan register. The design incorporates a test access port system that controls the operation of these cells, enabling built-in self-testing. The input boundary-scan register can function as a test pattern generator, while the output boundary-scan register serves as an output response analyzer. This innovative approach allows for efficient testing and analysis of logic circuits.
Career Highlights
Ching-Hong Tsai is affiliated with the National Science Council of the Republic of China, where he continues to advance research in electronic testing technologies. His work has been instrumental in improving the reliability and efficiency of electronic devices through innovative testing methods.
Collaborations
Ching-Hong Tsai has collaborated with notable colleagues, including Jin-Hua Hong and Cheng-Wen Wu. Their combined expertise has contributed to the development of advanced testing technologies in the field.
Conclusion
Ching-Hong Tsai's contributions to boundary scan technology exemplify the importance of innovation in electronic testing. His patent reflects a commitment to enhancing the reliability of electronic devices through built-in self-testing capabilities.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile