Taoyuan, Taiwan

Ching-Chiu Liao

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Industrial Technology Research Institute. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ching-Chiu Liao. Retrieved from https://idiyas.com/inventor/ching-chiu-liao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

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Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Ching-Chiu Liao: Innovator in Stereoscopic Display Measurement

Introduction

Ching-Chiu Liao is an inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of stereoscopic display technology. His innovative approach focuses on measurement methods that enhance the accuracy and effectiveness of stereoscopic displays.

Latest Patent Applications

Ching-Chiu Liao has filed a patent application titled "MEASUREMENT METHOD, MEASUREMENT APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR A STEREOSCOPIC DISPLAY." This application outlines a measurement method designed to assess a stereoscopic display. The method involves causing at least three different displaying positions to emit lights corresponding to a first viewing zone. It measures the light intensities emitted by these positions to obtain multiple sets of first view light intensity distribution data. Similarly, it also measures light intensities for a second viewing zone to gather second view light intensity distribution data. The application further details the calculation of a comprehensive distribution data set based on the collected intensity data.

Conclusion

Ching-Chiu Liao's work in developing measurement methods for stereoscopic displays showcases his innovative spirit and dedication to advancing technology in this field. His contributions are poised to impact the future of display technology significantly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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