This inventor holds 2 USPTO granted patents. Top assignee: Amtran Technology Co., Ltd.. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: Chin-Kun Huang: Innovator in Automatic Testing Technologies
Introduction
Chin-Kun Huang is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of automatic testing technologies, holding a total of 2 patents. His innovative work focuses on enhancing the efficiency and accuracy of testing devices.
Latest Patents
Huang's latest patents include an "Automatic Test Method" and an "Automatic Test System and Device Thereof." The automatic test method involves generating a sample video based on first and second sample photos. This video is displayed by the device under test, and test photos are captured by a camera. The first sample photos are then compared with the test photos to determine if the display function of the device is functioning correctly. The processor generates a display error message or a pass message based on the comparison results.
The automatic test device patent describes a system that includes connection ports, a processor, and a transmission integrated interface. The device is designed to couple with a device under test, transmitting test instructions and receiving test signals to ensure the device operates correctly in test mode.
Career Highlights
Chin-Kun Huang is currently employed at Amtran Technology Co., Ltd., where he continues to develop innovative testing solutions. His work has significantly impacted the efficiency of device testing processes.
Collaborations
Huang collaborates with talented coworkers, including Yu-Ruei Li and Peng-Ta Chiu, contributing to the advancement of automatic testing technologies.
Conclusion
Chin-Kun Huang's contributions to automatic testing technologies demonstrate his commitment to innovation and excellence in the field. His patents reflect a deep understanding of device functionality and testing efficiency.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile