The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2022

Filed:

Dec. 03, 2020
Applicant:

Amtran Technology Co., Ltd., New Taipei, TW;

Inventors:

Chin-Kun Huang, New Taipei, TW;

Yu-Ruei Li, New Taipei, TW;

Peng-Ta Chiu, New Taipei, TW;

Assignee:

AmTRAN Technology Co., Ltd., New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/04 (2006.01); G06T 7/00 (2017.01); H04R 29/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/04 (2013.01); G06T 7/001 (2013.01); H04R 29/001 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30108 (2013.01);
Abstract

An automatic test method for testing functions of a device under test is disclosed. The automatic test method includes the following operations. A sample video is generated based on first sample photos and at least one second sample photo by a processor. The sample video is displayed by the device under test and test photos are generated based on the content of the displayed sample video captured by a camera. The first sample photos are compared with the test photos to generate a display compared result. A display error message or a display pass message is generated based on the display compared result by the processor, configured to indicate that whether a display function of the device under test is dysfunctional.


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