Zhubei, Taiwan

Chih-Wei Chen

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Amazing Microelectronic Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chih-Wei Chen. Retrieved from https://idiyas.com/inventor/chih-wei-chen-ykcguj8c

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chih-Wei Chen and His Electrostatic Discharge Protection Invention.

Introduction

Chih-Wei Chen is an inventor based in Zhubei, Taiwan. His work includes a patented design for protecting electronic devices from electrostatic discharge.

Latest Patents

Chen is associated with 1 patent, titled “Electrostatic Discharge (ESD) Protection Device.” The invention describes a semiconductor structure with a P-type substrate, an N-type well, and several heavily doped regions. An external conductive wire couples the N-type doped area to the N-type well while keeping it electrically decoupled from the first P-type heavily doped area. The design also describes an alternative configuration in which an N-type substrate and a P-type well replace the P-type substrate and N-type well.

Career Highlights

Chen is associated with Amazing Microelectronic Corporation. His patent focuses on an ESD protection structure intended to help safeguard electronic circuitry against electrostatic discharge.

Collaborations

The available information associates Chen’s invention with Amazing Microelectronic Corporation but does not identify specific collaborators or co-inventors.

Conclusion

Chih-Wei Chen’s patent presents a semiconductor-based approach to ESD protection, reflecting his contribution to electronic device design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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