This inventor holds 3 USPTO granted patents. Top assignees: Faraday Technology Corporation, National Tsing Hua University. Active years: 2002-2006.
Location History:
- Taipei Hsien, TW (2002 - 2003)
- Hsinchu, TW (2006)
Company Filing History:
2 out of 411 
1 out of 1,308 Years Active: 2002-2006
Title: The Innovations of Chih-Wea Wang
Introduction
Chih-Wea Wang is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of memory testing and diagnostics, holding a total of 3 patents. His work focuses on enhancing the efficiency and reliability of memory units, particularly in static random access memory (SRAM).
Latest Patents
One of his latest patents is a "Multi-port memory testing method utilizing a sequence folding scheme for testing time reduction." This innovative method generates test clock signals with varying delay periods to control memory access through different ports. By conducting consecutive memory operations in a folded sequence, the method ensures that all operations are completed within the same test clock cycle, thereby optimizing testing time.
Another significant patent is the "Built-in programmable self-diagnostic circuit for SRAM unit." This circuit is designed to identify and locate faults within an SRAM unit. It comprises multiplexers, a demultiplexer, a test pattern generator, a fault location indicator, and a controller. The circuit can utilize either internal or pre-programmed test instructions to effectively diagnose and repair faults in the SRAM unit.
Career Highlights
Chih-Wea Wang has worked with prominent organizations such as Faraday Technology Corporation and National Tsing Hua University. His experience in these institutions has allowed him to develop and refine his innovative ideas in memory technology.
Collaborations
Throughout his career, Wang has collaborated with talented individuals, including Cheng-Wen Wu and Chi-Feng Wu. These partnerships have contributed to the advancement of his research and inventions.
Conclusion
Chih-Wea Wang's contributions to memory testing and diagnostics have made a significant impact in the field. His innovative patents reflect his dedication to improving technology and enhancing the reliability of memory units.