This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: Industrial Technology Research Institute. Active years: 2012-2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012-2013
Title: Chih-Sheng Jao: Innovator in Lithography Technology
Introduction
Chih-Sheng Jao is a prominent inventor based in Taoyuan County, Taiwan. He has made significant contributions to the field of lithography, particularly in the development of methods and apparatuses for generating periodic patterns. With a total of 2 patents to his name, Jao's work has the potential to enhance the efficiency and yield of lithographic processes.
Latest Patents
One of Jao's latest patents is titled "Method and apparatus for generating periodic patterns by step-and-align interference lithography." This invention provides a novel approach to creating periodic patterns by utilizing at least two coherent light beams. These beams are controlled to project onto a substrate, forming an interference-patterned region. By moving the substrate or the light beams stepwise, a large patterned area can be achieved. This method not only shortens the optical path and exposure time but also reduces defect formation during lithographic processing, ultimately improving yield.
Career Highlights
Chih-Sheng Jao is affiliated with the Industrial Technology Research Institute, where he continues to innovate and develop new technologies. His work in lithography has positioned him as a key figure in advancing manufacturing processes in various industries.
Collaborations
Jao has collaborated with notable colleagues, including Lon A Wang and Yung-Pin Chen. These partnerships have contributed to the success of his research and the development of his patents.
Conclusion
Chih-Sheng Jao's contributions to lithography technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in lithographic processes, paving the way for advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
