Chih-Ping Lee

Title: Chih-Ping Lee: Innovator in Test Pattern Structures

Introduction

Chih-Ping Lee is a notable inventor based in Singapore, recognized for his contributions to the field of semiconductor technology. He has developed innovative solutions that enhance the efficiency and reliability of electronic devices. His work is particularly significant in the area of test pattern structures, which are crucial for ensuring the functionality of integrated circuits.

Latest Patents

Chih-Ping Lee holds a patent for a test pattern structure that includes a first conductive layer and a second conductive layer. This innovative design allows the second conductive layer to be directly disposed on the first conductive layer, with multiple connection interfaces linking the two layers. The test pattern structure he developed can detect interconnection failures quickly and accurately, eliminating the need for scanning electron microscope (SEM) identification.

Career Highlights

Chih-Ping Lee is currently employed at United Microelectronics Corporation, a leading global semiconductor foundry. His role at the company allows him to apply his expertise in semiconductor technology and contribute to the development of advanced electronic components. His patent reflects his commitment to improving testing methodologies in the semiconductor industry.

Collaborations

Chih-Ping Lee has collaborated with esteemed colleagues such as Da-Jiang Yang and Rui-Huang Cheng. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas within the field.

Conclusion

Chih-Ping Lee's contributions to the semiconductor industry, particularly through his patented test pattern structure, demonstrate his innovative spirit and dedication to advancing technology. His work continues to impact the efficiency of electronic devices, making him a significant figure in the field.