Chih-Mihg Ke

Title: Chih-Mihg Ke: Innovator in Semiconductor Defect Extraction

Introduction

Chih-Mihg Ke is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the area of defect extraction. His innovative approach has the potential to enhance the efficiency and reliability of semiconductor manufacturing processes.

Latest Patents

Chih-Mihg Ke holds a patent titled "Method and apparatus for extracting systematic defects." This patent outlines a method for systematic defect extraction in semiconductor wafers. The process involves defining primary and secondary areas in a wafer layout, identifying defects through initial inspections, and removing non-critical defects. Sensitive regions around critical features are then inspected to identify potentially systematic defects, followed by a Scanning Electron Microscopy (SEM) process to confirm the nature of these defects. This innovative method aims to improve the quality control in semiconductor production.

Career Highlights

Chih-Mihg Ke is associated with Taiwan Semiconductor Manufacturing Company Limited, a leading player in the semiconductor industry. His work focuses on enhancing defect detection and extraction methods, which are crucial for maintaining high standards in semiconductor fabrication. His expertise and innovative solutions contribute to the company's reputation for excellence in manufacturing.

Collaborations

Chih-Mihg Ke collaborates with notable colleagues such as Jia-Rui Hu and Kai-Hsiung Chen. Their combined efforts in research and development have led to advancements in semiconductor technology and defect management.

Conclusion

Chih-Mihg Ke is a key figure in the semiconductor industry, recognized for his innovative methods in defect extraction. His contributions not only advance technology but also enhance the overall quality of semiconductor products.