Tainan, Taiwan

Chih-Kuan Chang

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: United Microelectronics Corp.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chih-Kuan Chang. Retrieved from https://idiyas.com/inventor/chih-kuan-chang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chih-Kuan Chang and Manufacturing Process Monitoring.

Introduction

Chih-Kuan Chang is an inventor associated with Tainan, Taiwan, and United Microelectronics Corporation. His listed patent focuses on using data analysis to monitor manufacturing processes and identify conditions that may require attention.

Latest Patents

Chang is credited with 1 patent: “Manufacturing Control Method and Non-Transitory Computer Readable Media.” The invention describes a computer-based method that divides outlier-filtered data into subgroups according to a reference value, calculates standard deviations for those groups, and uses the results to establish and adjust upper and lower warning limits. When sensing data exceeds either limit, the system triggers a warning signal. The method is designed to support manufacturing control through statistical monitoring.

Career Highlights

The available information associates Chang with United Microelectronics Corporation and identifies his patent contribution in manufacturing control. The patent applies statistical analysis and automated alerts to manufacturing data.

Collaborations

The patent information provided connects Chang’s work with United Microelectronics Corporation. No additional collaborators are identified in the supplied details.

Conclusion

Chih-Kuan Chang’s listed invention uses subgroup-based statistical analysis and warning limits to help detect unusual manufacturing measurements and prompt timely alerts.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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