This inventor holds 3 USPTO granted patents. Top assignee: 3Dfamily Technology Co., Ltd.. Active years: 2015-2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015-2017
Title: Chih-Chin Hsu: Inventor in Measurement and Optical Systems
Introduction
Chih-Chin Hsu is an inventor based in Taipei, Taiwan. His patent work includes technologies for precision measurement and optical wavelength correction. He is associated with 3Dfamily Technology Co., Ltd. Hsu is named on 3 patents.
Latest Patents
One of Hsu’s latest patents, “Device and Method for Roundness Measurement,” describes a system for measuring an object’s roundness. The object is mounted on a rotary table, while two measurement units contact opposite sides of it. As the table rotates, the system intermittently measures the shortest distance between the units’ parallel measuring surfaces. A processing unit uses the resulting variation data to generate measurement results after a full rotation.
His patent “Real-Time Wavelength Correction System for Visible Light” addresses wavelength correction in an optical system. It uses zero-order and first-order diffracted parallel light beams, with each beam forming a spot at a corresponding back focal plane. By tracking changes in the spots, the system determines angular drift associated with temperature variation and uses that information to correct the parallel beam’s wavelength in real time.
Career Highlights
Hsu’s disclosed inventions focus on practical measurement and optical technologies. The roundness measurement system combines mechanical rotation with distance sensing and data processing, while the wavelength correction system uses diffracted light and spot tracking to compensate for temperature-related drift.
Collaborations
Hsu is associated with 3Dfamily Technology Co., Ltd. His listed coworker is Kuang-Chao Fan.
Conclusion
Chih-Chin Hsu’s patent portfolio reflects work in precision measurement and visible-light optics, including systems designed to improve roundness measurement and correct wavelength drift in real time.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile