The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Jul. 07, 2015
Applicant:

3dfamily Technology Co., Ltd., New Taipei, TW;

Inventors:

Kuang-Chao Fan, Taipei, TW;

Chih-Chin Hsu, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); H01S 3/00 (2006.01); G02B 27/42 (2006.01); G02B 27/00 (2006.01); H01S 5/0687 (2006.01);
U.S. Cl.
CPC ...
H01S 3/0014 (2013.01); G02B 27/0056 (2013.01); G02B 27/4244 (2013.01); H01S 5/0687 (2013.01);
Abstract

A real-time wavelength correction system for visible light is co-operated with an optical system to make a parallel light beam split into a zero-order diffractive parallel light beam and a first-order diffractive parallel light beam. The zero-order diffractive parallel light beam focuses on a first back focal plane to form a first light spot. A drift of the first light spot is applied to determine an angular drift of the parallel light beam. The first-order diffractive parallel light beam is focused on a second back focal plane to form a second light spot. A drift of the second light spot is applied to determine an angular drift of the first-order diffractive parallel light beam. The angular drifts of the parallel light beam and the first-order diffractive parallel light beam, which are changed with real time temperature variation, are applied to correct the wavelength of the parallel light beam.


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