Zhubei, Taiwan

Chih-An Wei

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chih-An Wei. Retrieved from https://idiyas.com/inventor/chih-an-wei

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Chih-An Wei: Innovator in Rail Inspection Technology

Introduction

Chih-An Wei is a notable inventor based in Zhubei, Taiwan. He has made significant contributions to the field of rail inspection technology. His innovative approach combines physical inspection with advanced monitoring techniques.

Latest Patents

Chih-An Wei holds a patent for an invention titled "Enhanced Rail Inspection." This patent discusses a monitor vehicle that operates on one or more tracks of a rail system. The vehicle performs physical rail inspections while simultaneously monitoring and analyzing other system parameters that accompany the physical rail.

Career Highlights

Chih-An Wei is currently employed at Taiwan Semiconductor Manufacturing Company Ltd. His work focuses on enhancing the safety and efficiency of rail systems through innovative inspection methods. His dedication to improving rail technology has positioned him as a key figure in this field.

Collaborations

Chih-An Wei has collaborated with talented individuals such as Chih-Chieh Fu and Ming Fang Wang. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Chih-An Wei's contributions to rail inspection technology exemplify the impact of innovation in enhancing safety and efficiency in transportation systems. His work continues to inspire advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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