Chien-Hsiang Huang

Title: Chien-Hsiang Huang: Innovator in Wafer Scanning Technology

Introduction

Chien-Hsiang Huang is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in wafer scanning methods. With a total of 3 patents to his name, Huang continues to push the boundaries of innovation in his industry.

Latest Patents

Huang's latest patents focus on methods and systems for scanning wafers. One of his notable inventions provides a method and a system for capturing a defect image of a wafer. The system generates a reference image corresponding to the first defect image based on a reference image generation model. Additionally, it creates a defect marked image based on the defect image and the reference image. This innovative approach enhances the accuracy and efficiency of wafer inspection processes.

Career Highlights

Chien-Hsiang Huang is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading player in the semiconductor industry. His work at TSMC has allowed him to collaborate with some of the brightest minds in the field, furthering advancements in semiconductor technology.

Collaborations

Huang has worked alongside talented colleagues such as Pei-Hsuan Lee and Kuang-Shing Chen. Their collaborative efforts have contributed to the development of cutting-edge technologies in wafer scanning.

Conclusion

Chien-Hsiang Huang is a key figure in the realm of semiconductor innovation, with a focus on wafer scanning technology. His contributions and collaborations continue to shape the future of the industry.