Keelung, Taiwan

Chiao-Wei Lin


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Chiao-Wei Lin: Innovator in Object Contour Detection

Introduction

Chiao-Wei Lin is a notable inventor based in Keelung, Taiwan. He has made significant contributions to the field of object contour detection, particularly through his innovative patent. His work focuses on enhancing the accuracy of tracing object contours, which has applications in various technological domains.

Latest Patents

Chiao-Wei Lin holds a patent titled "Method for auto-depicting trends in object contours." This patent introduces a method known as ADTOC, which employs a sifting process to determine a significant angular value by evaluating multiple angular values within a predefined range. ADTOC is distinguished by its probe-ahead concept, which allows for the acquisition of a reference angular value along the current route. This reference value is then utilized to adjust the significant angular value, enabling timely corrections to the subsequent trace direction. The method effectively addresses challenges such as contours with discontinuous segments caused by noise, obstacles, and variations in illumination and shading, all without the need for a predefined auxiliary route.

Career Highlights

Throughout his career, Chiao-Wei Lin has worked with several companies, including Iei Integration Corporation and Armorlink Sh Corporation. His experience in these organizations has contributed to his expertise in the field of object contour detection and innovation.

Collaborations

Chiao-Wei Lin has collaborated with notable colleagues such as Chun-Shun Tseng and Jung-Hua Wang. Their joint efforts have further advanced the research and development of technologies related to object contour detection.

Conclusion

Chiao-Wei Lin's contributions to the field of object contour detection through his innovative patent demonstrate his commitment to advancing technology. His work not only enhances the accuracy of tracing object contours but also addresses various challenges in the field.

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