The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Aug. 23, 2013
Iei Integration Corp., New Taipei, TW;
Armorlink Sh Corp., Shang-Hai, CN;
Chun-Shun Tseng, Keelung, TW;
Jung-Hua Wang, Keelung, TW;
Shan-Chun Tsai, Keelung, TW;
Chiao-Wei Lin, Keelung, TW;
Chang-Te Lin, Keelung, TW;
Yi-Hua Wang, Keelung, TW;
IEI Integration Corp., Xizhi Dist., New Taipei, TW;
Armorlink SH Corp., Min-Sing-Sin-Jhuang Industrial District, Shang-Hai, CN;
Abstract
Disclosed herein is a method for auto-depicting trends in object contours (referred to as ADTOC). At the heart of ADTOC is a sifting process to determine a significant angular value via evaluating a plurality of angular values in a predefined range. ADTOC is characterized in that a probe-ahead concept is applied to obtain a reference angular value along the current route, and then the probed angular value is used to modify the significant angular value in order to timely correct the subsequent trace direction, thus achieving more accurate trace result. Contours with discontinuous segments caused by noise, obstacles, illumination, shading variations, etc. can also be auto-depicted without requiring a predefined auxiliary route.