Singapore, Singapore

Chiang Huan Saw

This inventor holds 1 USPTO granted patent. Top assignee: Aem Singapore Pte. Ltd.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chiang Huan Saw. Retrieved from https://idiyas.com/inventor/chiang-huan-saw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Innovations by Chiang Huan Saw

Introduction

Chiang Huan Saw is a notable inventor based in Singapore, known for his contributions to electronic testing systems. He has developed a unique patent that addresses the challenges faced in testing electronic devices under varying conditions. His work is significant in enhancing the efficiency and adaptability of electronic testing processes.

Latest Patents

Chiang Huan Saw holds a patent for a "Configurable Electronic Device Tester System." This innovative system is designed to accommodate different test processes and thermal conditions. It features a device handler that operates with multiple testers and includes a thermal environment module to control the temperature during testing. The design allows for easy expansion by stacking additional testers vertically, thereby increasing test capacity without requiring more floor space.

Career Highlights

Chiang is currently employed at AEM Singapore Pte. Ltd., where he continues to innovate in the field of electronic testing. His work has contributed to the advancement of testing technologies, making them more versatile and efficient.

Collaborations

Chiang has collaborated with talented coworkers, including Kok Keong Ong and See Jean Chan, who have contributed to his projects and innovations.

Conclusion

Chiang Huan Saw's contributions to electronic testing systems exemplify the importance of innovation in technology. His patented system not only improves testing efficiency but also addresses the need for adaptability in various testing environments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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