The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Oct. 27, 2015
Applicant:

Aem Singapore Pte. Ltd., Singapore, SG;

Inventors:

Boon Hua How, Singapore, SG;

Kok Keong Ong, Singapore, SG;

Chiang Huan Saw, Singapore, SG;

See Jean Chan, Singapore, SG;

Wee Tick Lo, Singapore, SG;

Assignee:

AEM SINGAPORE PTE. LTD., Singapore, SG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/003 (2013.01);
Abstract

A configurable electronic test system that is adapted for varying test processes and thermal conditions, consisting of a device handler working with multiple testers and a thermal environment module for controlling the thermal condition during test. The test system can be easily expanded by stacking more testers vertically for more test capacity without requiring an increase in floor space.


Find Patent Forward Citations

How, Boon. (2018). Configurable electronic device tester system (U.S. Patent No. 9927478). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9927478

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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