Hsinchu, Taiwan

Chiah-Chih Chen

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chiah-Chih Chen. Retrieved from https://idiyas.com/inventor/chiah-chih-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Chiah-Chih Chen and Plasma Ion Measurement

Introduction

Chiah-Chih Chen is an inventor associated with Hsinchu, Taiwan. Her patent work addresses measuring ion distribution in plasma systems, with an application relevant to monitoring wafer processing.

Latest Patents

Chen is named on 1 patent, titled “Ion Collector for Use in Plasma Systems.” The invention describes an ion collector with multiple physically separated segments arranged around a substrate support. Each segment has a conductive element that carries current in response to ions from a plasma, and a corresponding integrator uses that current to determine the ion distribution at that segment. By comparing measurements across the segments, the system can help assess how uniformly ions are distributed across a wafer during plasma processing.

Career Highlights

Chen is associated with Taiwan Semiconductor Manufacturing Company Limited. Her patent reflects work on plasma-process monitoring and the measurement of ion distribution.

Collaborations

The supplied information identifies Otto Chen and Chi-Ying Wu as Chen’s coworkers. Their specific roles in the patent or related work are not provided.

Conclusion

Chiah-Chih Chen’s patent describes a segmented ion-collection system designed to help evaluate ion-distribution uniformity during plasma processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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