Chia-Yeh Lee

Title: Innovations by Chia-Yeh Lee

Introduction

Chia-Yeh Lee is a notable inventor based in Hsinchu Science Park, Taiwan. He has made significant contributions to the field of optical inspection and material counting. With a total of 2 patents, his work showcases innovative methods that enhance efficiency and accuracy in various applications.

Latest Patents

Chia-Yeh Lee's latest patents include an automated optical inspection method and system, as well as a method of counting sheet materials. The automated optical inspection method involves capturing an original image of a target object using an optical lens. It performs edge detection to obtain an edge image and calculates characteristic values based on pixel values. This method aims to create an optimal regression model for identifying defects in target objects. The method of counting sheet materials involves receiving an image of a pile of sheet materials and processing it to determine the number of sheets accurately.

Career Highlights

Chia-Yeh Lee is currently employed at GlobalWafers Co., Ltd., where he applies his expertise in developing innovative solutions. His work has contributed to advancements in optical inspection technologies, which are crucial for quality control in manufacturing processes.

Collaborations

Chia-Yeh Lee has collaborated with notable coworkers, including Cheng-Wei Gu and Shang-Chi Wang. Their combined efforts have led to the development of cutting-edge technologies in their respective fields.

Conclusion

Chia-Yeh Lee's contributions to innovation in optical inspection and material counting demonstrate his commitment to advancing technology. His patents reflect a deep understanding of the challenges in these areas and provide effective solutions that benefit various industries.