Chia-Hung Hung

Title: Innovations by Chia-Hung Hung in Wafer Probe Technology.

Introduction

Chia-Hung Hung is an accomplished inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of semiconductor testing, particularly through his innovative designs in wafer probe technology. His work has led to advancements that enhance the efficiency and accuracy of testing devices.

Latest Patents

Chia-Hung Hung holds a patent for a wafer probe station. This invention includes a thermal chuck, a chuck stage, a platen, several probes, a first focusing device, a second focusing device, and a thermal plate. The thermal chuck is designed to heat up to an operational temperature and securely hold a device under test (DUT). The chuck stage is connected to the thermal chuck and facilitates its movement. Positioned between the chuck stage and the platen, the thermal chuck plays a crucial role in the testing process. The probes are strategically placed on the platen to make contact with the DUT. The first focusing device is located on the platen to focus on the DUT, while the second focusing device is situated on the chuck stage to focus on the probes. Additionally, the thermal plate, which is positioned between the second focusing device and the platen, is configured to heat up to the operational temperature and features a through hole that aligns with the second focusing device.

Career Highlights

Chia-Hung Hung is currently employed at Mpi Corporation, where he continues to innovate and develop new technologies in the semiconductor industry. His expertise and dedication to his work have made him a valuable asset to the company.

Collaborations

Chia-Hung has collaborated with Stojan Kanev, working together to advance their projects and contribute to the field of semiconductor testing.

Conclusion

Chia-Hung Hung's contributions to wafer probe technology exemplify his commitment to innovation in the semiconductor industry. His patent for the wafer probe station showcases his ability to create solutions that improve testing processes.