Location History:
- Taipei, TW (2010)
- Taipei Hsien, TW (2012 - 2014)
- New Taipei, TW (2014 - 2016)
Company Filing History:
Years Active: 2010-2016
Title: Innovations of Chia-Hsien Li
Introduction
Chia-Hsien Li is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of measurement technology, holding a total of 13 patents. His work focuses on developing innovative methods and devices that enhance accuracy and efficiency in height and length measurement.
Latest Patents
One of his latest patents is a height measuring apparatus and method thereof. This invention discloses a method suitable for indoor environments, which involves emitting a first laser to a ceiling via a first light path. The method determines whether a first reflective light corresponding to the first laser is received. It then emits a second laser to an object via a second light path reflected by the ceiling, determining whether a second reflective light corresponding to the second laser is received. The invention calculates the height of the object based on the lengths derived from the reflective lights. Another notable patent is a length measurement method and device. This method includes steps of emitting a laser via a laser ranging module to detect a reference distance between a reference point on a target and the module. It executes a border detecting procedure to identify the target's border and calculates the measurement distance accordingly.
Career Highlights
Chia-Hsien Li is currently associated with Wistron Corporation, where he continues to innovate and develop new technologies. His work has significantly impacted the measurement industry, providing solutions that improve precision and usability.
Collaborations
Chia-Hsien Li collaborates with talented coworkers, including Yao-Tsung Chang and Pai-Yang Lin. Their combined expertise fosters an environment of innovation and creativity.
Conclusion
Chia-Hsien Li's contributions to measurement technology through his patents demonstrate his commitment to innovation. His work not only enhances measurement accuracy but also showcases the potential for future advancements in this field.