The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Apr. 23, 2014
Applicant:

Wistron Corp., New Taipei, TW;

Inventors:

Wen-Chun Tsao, New Taipei, TW;

Yao-Tsung Chang, New Taipei, TW;

Chia-Hsien Li, New Taipei, TW;

Assignee:

WISTRON CORP., New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 1/04 (2006.01); G01B 11/02 (2006.01); G01S 5/00 (2006.01); G01C 3/08 (2006.01); G01C 15/00 (2006.01);
U.S. Cl.
CPC ...
G01S 5/00 (2013.01); G01C 3/08 (2013.01); G01B 11/02 (2013.01); G01C 1/04 (2013.01); G01C 15/002 (2013.01);
Abstract

The present invention proposes a length measurement method and a length measurement device. The length measurement method includes steps of emitting the laser via a laser ranging module in a reference direction to order to detect a reference distance between a reference point on a target and the laser ranging module, taking the reference direction as a the measurement direction, taking the reference distance as a first distance, executing a border detecting procedure according to the measurement direction and the first distance in order to detect a border of the target, and calculating measurement distance between the border and the reference point according to border location information of the laser ranging module corresponding to the border, the reference direction and the reference distance.


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