The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

May. 12, 2014
Applicant:

Wistron Corp., New Taipei, TW;

Inventors:

Yao-Tsung Chang, New Taipei, TW;

Chia-Hsien Li, New Taipei, TW;

Pai-Yang Lin, New Taipei, TW;

Shun-Chi Chung, New Taipei, TW;

Assignee:

WISTRON CORP., New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01B 11/06 (2006.01); A61B 5/107 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0608 (2013.01); A61B 5/1072 (2013.01); A61B 2562/0233 (2013.01);
Abstract

A height measuring apparatus and a method thereof are disclosed. The disclosed method is suitable for an indoor environment. The disclosed method comprises emitting a first laser to a ceil via a first light path, determining whether a first reflective light corresponding to the first laser is received, emitting a second laser to an object via a second light path reflected by the ceil, determining whether a second reflective light corresponding to the second laser is received, calculating a first length according to a first data corresponding to the first reflective light, calculating a second length according to a second data corresponding to the second reflective light, and calculating an object height of the object according to the first length and the second length.


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