Taipei, Taiwan

Chia-Cheng Kuo

This inventor holds 1 USPTO granted patent. Top assignee: National Taipei University of Technology. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chia-Cheng Kuo. Retrieved from https://idiyas.com/inventor/chia-cheng-kuo-zmscgde3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Innovations of Chia-Cheng Kuo

Introduction

Chia-Cheng Kuo is a notable inventor based in Taipei County, Taiwan. He has made significant contributions to the field of image processing, particularly in defect inspection methods. His innovative approach has led to the development of a unique patent that addresses challenges in image analysis.

Latest Patents

Chia-Cheng Kuo holds a patent for a "Non-uniform image defect inspection method." This method involves several steps, including inputting an original two-dimensional image and separating a non-uniform background image from it using Discrete Cosine Transform (DCT). The process results in a residual image that excludes the non-uniform background, allowing for effective binarization and segmentation to extract defects. The segmented defects serve as the inspection results, showcasing the method's effectiveness in identifying image imperfections.

Career Highlights

Chia-Cheng Kuo is affiliated with the National Taipei University of Technology, where he applies his expertise in image processing and technology. His work at the university has allowed him to engage in research and development, contributing to advancements in the field.

Collaborations

Chia-Cheng Kuo collaborates with his coworker, Liang-Chia Chen, to further enhance their research and innovation efforts. Their partnership exemplifies the importance of teamwork in driving technological advancements.

Conclusion

Chia-Cheng Kuo's contributions to image defect inspection methods highlight his innovative spirit and dedication to advancing technology. His patent reflects a significant step forward in the field, demonstrating the potential for improved image analysis techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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