The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2012
Filed:
Nov. 01, 2007
Applicants:
Liang-chia Chen, Zhonghe, TW;
Chia-cheng Kuo, Taipei County, TW;
Inventors:
Liang-Chia Chen, Zhonghe, TW;
Chia-Cheng Kuo, Taipei County, TW;
Assignee:
National Taipei University of Technology, Taipei, TW;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06K 9/00 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract
A non-uniform image defect inspection method includes steps of inputting an original two-dimensional image; separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; binarization segmenting the residual image to extract defects from the residual image, wherein the segmented defects are the inspection results.