Yunlin, Taiwan

Chi-Wen Yang

This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chi-Wen Yang. Retrieved from https://idiyas.com/inventor/chi-wen-yang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Chi-Wen Yang: Innovator in Optical Microscopy

Introduction

Chi-Wen Yang is a notable inventor based in Yunlin, Taiwan. He has made significant contributions to the field of optical microscopy, particularly with his innovative designs and patents. His work has implications for various scientific and industrial applications.

Latest Patents

Chi-Wen Yang holds a patent for a "Knock mode scanning near-field optical microscope." This invention comprises a light source member and an optical fiber probe that forms a near-field point source of light. The optical fiber probe is attached to a suspension arm member of an oscillation member, which includes piezoelectric ceramics. This design is driven by a harmonic wave signal, allowing for feedback control through changes in amplitude and phase of the optical fiber probe.

Career Highlights

Chi-Wen Yang is affiliated with the Industrial Technology Research Institute, where he continues to advance research in optical technologies. His work has garnered attention for its innovative approach to microscopy, enhancing the capabilities of optical imaging.

Collaborations

Chi-Wen Yang has collaborated with notable colleagues, including Shih-Che Lo and Yun-Hui Chang, who contribute to the research environment at the Industrial Technology Research Institute.

Conclusion

Chi-Wen Yang's contributions to optical microscopy through his patented inventions highlight his role as an influential inventor in the field. His work continues to inspire advancements in technology and research.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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