The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2002

Filed:

Aug. 06, 1999
Applicant:
Inventors:

Din-Ping Tsai, Taichung, TW;

Shih-Che Lo, I Lan Hsien, TW;

Yun-Hui Chang, Taipei Hsien, TW;

Shih-Chou Chen, Hsin Chu, TW;

Yuan-Ying Lu, Taipei Hsien, TW;

Chi-Wen Yang, Yun Lin Hsien, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 3/14 ; H01J 3/704 ;
U.S. Cl.
CPC ...
H01J 3/14 ; H01J 3/704 ;
Abstract

A knock mode scanning near-field optical microscope comprises a light source member, an optical fiber probe connected at one end thereof with the light source member such that other end of the optical fiber probe forms a near-field point source of light, and that the optical fiber probe is attached with one end of a suspension arm member of an oscillation member. The oscillation member further has a piezoelectric ceramics, which is disposed on the suspension arm member, and is driven by a harmonic wave signal by a signal feedback member so as to bring about a change in amplitude and phase of the optical fiber probe in order to result in a feedback control.


Find Patent Forward Citations

Loading…