Singapore, Singapore

Chi Seng Ng

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nanyang Technological University. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chi Seng Ng. Retrieved from https://idiyas.com/inventor/chi-seng-ng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations by Chi Seng Ng in 3D Surface Measurement

Introduction

Chi Seng Ng is a notable inventor based in Singapore, recognized for his contributions to the field of 3D surface measurement. His innovative work has led to the development of advanced technologies that enhance measurement accuracy and efficiency.

Latest Patents

Chi Seng Ng holds a patent for an "Apparatus and method for 3D surface measurement." This apparatus includes a first projector and a second projector, both configured to project fringe patterns onto a target surface. Additionally, it features a first camera and a second camera that capture the projected fringe patterns. A computer processes these captured patterns, performing data stitching and merging to achieve a comprehensive 3D surface reconstruction. This invention showcases his expertise in optical measurement technologies.

Career Highlights

Chi Seng Ng is affiliated with Nanyang Technological University, where he contributes to research and development in innovative measurement techniques. His work is instrumental in advancing the capabilities of 3D surface measurement technologies.

Collaborations

Chi Seng Ng has collaborated with esteemed colleagues such as Lei Huang and Anand Krishna Asundi, further enhancing the impact of his research and inventions.

Conclusion

Chi Seng Ng's innovative contributions to 3D surface measurement exemplify the importance of technological advancements in precision measurement. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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