The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2016

Filed:

Oct. 17, 2012
Applicant:

Nanyang Technological University, Singapore, SG;

Inventors:

Lei Huang, Singapore, SG;

Chi Seng Ng, Singapore, SG;

Hoe Jyh Koh, Singapore, SG;

Anand Krishna Asundi, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/25 (2006.01); G01B 11/245 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2545 (2013.01); G01B 11/245 (2013.01); G01B 11/25 (2013.01); G01N 21/8806 (2013.01); G06T 7/0057 (2013.01); G06T 7/0075 (2013.01);
Abstract

An apparatus for 3D surface measurement of a target surface, the apparatus comprising: a first projector configured to project a fringe pattern onto the target surface; a second projector configured to project a fringe pattern onto the target surface; a first camera configured to capture the fringe patterns projected by the first projector and the second projector; a second camera configured to capture the fringe patterns projected by the first projector and the second projector; and a computer configured to perform fringe pattern processing of the fringe patterns captured by the first camera and the second camera and to perform data stitching and merging to obtain a 3D surface reconstruction.


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