Taoyuan, Taiwan

Chi-Ming Liu


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Innovations in Integrated Circuit Testing: The Work of Chi-Ming Liu

Introduction: Chi-Ming Liu, an accomplished inventor based in Taoyuan, Taiwan, has made significant contributions to the field of integrated circuit testing. With one patent to his name, he showcases an aptitude for innovation that enhances the reliability of semiconductor devices.

Latest Patents: Liu’s patent, titled "Method and apparatus to estimate burn-in time by measurement of scribe-line devices, with stacking devices, and with common pads," presents a groundbreaking approach for estimating burn-in time for integrated circuit dies on a wafer. This innovative method utilizes a reliability testing structure strategically positioned in the scribe line area of a wafer, enabling improved estimation processes for integrated circuits. The patented technology comprises multiple evaluation device structures formed on a substrate, with groups stacked on the surface. These structures evaluate various failure mechanisms using a selection circuit that manages stimulus input and response output to determine hazard rates and, consequently, the required burn-in time for the integrated circuits.

Career Highlights: Chi-Ming Liu has established himself as a key contributor at Taiwan Semiconductor Manufacturing Company Limited, where he applies his expertise in developing reliable testing methods for semiconductor technology. His innovative spirit and dedication have been instrumental in advancing the reliability and effectiveness of integrated circuits.

Collaborations: Liu has collaborated with notable professionals in the field, including Kuo-Tso Chen, working together to improve integrated circuit testing methodologies. Their joint efforts have propelled advancements that benefit the semiconductor industry as a whole.

Conclusion: Chi-Ming Liu exemplifies the spirit of innovation within the technological landscape of Taiwan. His contributions, particularly in the reliability testing of integrated circuits, demonstrate the potential of inventive minds to drive progress in the semiconductor sector. As technology evolves, inventors like Liu will continue to play a vital role in shaping the future of electronics.

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