This inventor holds 1 USPTO granted patent. Top assignee: Mpi Corporation. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Chi-Hsien Li: Innovator in Semiconductor Testing Technology
Introduction
Chi-Hsien Li is a notable inventor recognized for his contributions to semiconductor testing technology. He has made significant advancements in the field, particularly through his innovative patent.
Latest Patents
Chi-Hsien Li holds a patent titled "Probe System for Testing of Devices Under Test Integrated on a Semiconductor Wafer, and Probe Card, Probe Head, and Guiding Plate Structure Therein." This invention addresses the challenges associated with testing devices on semiconductor wafers, enhancing the efficiency and accuracy of the testing process.
Career Highlights
Chi-Hsien Li is currently employed at Mpi Corporation, where he continues to develop cutting-edge technologies in the semiconductor industry. His work has been instrumental in improving testing methodologies, which are crucial for the advancement of electronic devices.
Collaborations
Chi-Hsien Li collaborates with Yu-Hao Chen, a fellow innovator in the field. Together, they work on projects that push the boundaries of semiconductor technology.
Conclusion
Chi-Hsien Li's contributions to semiconductor testing technology exemplify the impact of innovation in the electronics industry. His patent and ongoing work at Mpi Corporation highlight his commitment to advancing technology for better performance and reliability.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile