Chi-hoon Lee

Title: Chi-hoon Lee: Innovator in Semiconductor Technology

Introduction

Chi-hoon Lee is a prominent inventor based in Suwon, South Korea. He has made significant contributions to the field of semiconductor technology, holding a total of 8 patents. His work focuses on innovative methods for semiconductor device manufacturing and material deposition.

Latest Patents

Chi-hoon Lee's latest patents include a thickness prediction network learning method, a semiconductor device manufacturing method, and semiconductor material deposition equipment. The thickness prediction network learning method involves measuring the spectrums of optical characteristics of various semiconductor structures. This method generates sets of spectrum measurement data and thickness data, which are used to train a simulation network. The goal is to predict the thickness of semiconductor layers accurately. Another notable patent is a method for nondestructive measurements of the thickness of underlying layers. This method utilizes laser pulses to generate acoustic waves in a sample, allowing for precise thickness determination based on reflectance variations over time.

Career Highlights

Throughout his career, Chi-hoon Lee has worked with leading organizations in the technology sector. He has been associated with Samsung Electronics Co., Ltd. and the Korea Advanced Institute of Science and Technology. His experience in these prestigious companies has contributed to his expertise in semiconductor technologies.

Collaborations

Chi-hoon Lee has collaborated with notable colleagues, including Young-hoon Park and Eun-young Minn. Their joint efforts have further advanced the research and development of semiconductor technologies.

Conclusion

Chi-hoon Lee's innovative work in semiconductor technology has led to significant advancements in the field. His patents reflect a commitment to improving manufacturing processes and measurement techniques. His contributions continue to influence the semiconductor industry positively.