Chi Chung Francis Ling

Title: The Innovations of Chi Chung Francis Ling

Introduction

Chi Chung Francis Ling is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of semiconductor technology. His innovative work focuses on detecting atomic scale defects in semiconductors, which is crucial for the fabrication of high-quality electronic devices.

Latest Patents

Chi Chung Francis Ling holds a patent titled "Luminescence method for the in-line detection of atomic scale defects during fabrication of 4H—SiC diodes." This patent describes a method for detecting atomic scale defects in semiconductors. The process involves scanning the surface of the semiconductor with a field emission scanning electron microscope (SEM) to create an SEM image. Following this, the SEM image is scanned with a light detector and monochromator to obtain a cathodoluminescence (CL) spatial intensity map. The CL spectra are then determined, comparing the CL intensity to a threshold to identify defective semiconductors. He has 1 patent to his name.

Career Highlights

Chi Chung Francis Ling is affiliated with The University of Hong Kong, where he contributes to research and development in semiconductor technology. His work has implications for improving the reliability and performance of electronic devices.

Collaborations

Some of his notable coworkers include Sihua Li and Lok Ping Ho, who collaborate with him on various research projects.

Conclusion

Chi Chung Francis Ling's innovative methods in semiconductor defect detection highlight his significant contributions to technology. His work continues to influence the field and improve electronic device fabrication.