San Jose, CA, United States of America

Cheryl Staat

This inventor holds 1 USPTO granted patent. Top assignee: Therma-Wave, Inc.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Cheryl Staat. Retrieved from https://idiyas.com/inventor/cheryl-staat

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Innovator Spotlight: Cheryl Staat – Pioneering Scatterometry Standards

Introduction: Cheryl Staat, an accomplished inventor based in San Jose, California, has made notable contributions to the field of scatterometry. With one patented invention under her belt, she has demonstrated her innovative capabilities, providing essential tools for the semiconductor industry.

Latest Patents: Cheryl's patent, titled "Standardized Sample for Characterizing the Performance of a Scatterometer," addresses significant challenges faced by real-world scatterometers. It consists of four quadrants, each including an inner block surrounded by four outer blocks. The design features a repeated grating pattern within each block at varying resolutions and orientations. The ingenious aspect lies in the negative image relationship between matching gratings, ensuring precision in measurements. Additionally, the inner block presents a series of background patterns, which aid in simulating actual operational conditions. This innovation allows for rapid verification of scatterometer performance using techniques such as Scanning Electron Microscopy (SEM).

Career Highlights: Cheryl Staat has dedicated her career to research and innovation in semiconductor technologies. Currently affiliated with Therma-Wave, Inc., she continues to push the boundaries of what is achievable in scatterometry measurement standards. Her focus on precision and alignment sets a high benchmark for the industry.

Collaborations: Throughout her career, Cheryl has collaborated with other professionals in her field, including her colleagues Youxian Wen and Jon Opsal. Their joint efforts have helped enhance the capabilities of scatterometry and have fostered a culture of innovation at Therma-Wave.

Conclusion: Cheryl Staat's contributions to scatterometry exemplify her commitment to advancing technology in the semiconductor industry. With her innovative spirit and technical expertise, she remains an influential figure. Her patented invention is a testament to her creative approach and problem-solving abilities, paving the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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