This inventor holds 2 USPTO granted patents and 5 published patent applications. Top assignee: Minitab, Inc.. Active years: 2025-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025-2026
Title: Cheryl L Pammer: Innovator in Measurement Correction
Introduction
Cheryl L Pammer is a notable inventor based in San Diego, CA. She has made significant contributions to the field of measurement correction, particularly through her innovative patent. Her work focuses on enhancing the accuracy of low-resolution measurements, which has important implications in various scientific and engineering applications.
Latest Patents
Cheryl holds a patent for "Correcting low-resolution measurements." This invention involves methods and systems designed to correct low-resolution measurements that correspond to unobservable high-resolution measurements. The process introduces variation in a plurality of low-resolution measurements by iteratively computing perturbed values until a termination criterion is met. The resulting perturbed values achieve a higher resolution than the original low-resolution measurements. Additionally, a distribution test may be performed on the perturbed values that remain after the termination criteria is satisfied.
Career Highlights
Cheryl is currently employed at Minitab, Inc., where she continues to apply her expertise in measurement and data analysis. Her work at Minitab allows her to collaborate with other professionals in the field, further enhancing her contributions to innovation.
Collaborations
One of her notable coworkers is Robert E Kelly, with whom she collaborates on various projects related to measurement and data analysis.
Conclusion
Cheryl L Pammer's innovative work in correcting low-resolution measurements showcases her dedication to advancing measurement technologies. Her contributions are vital for improving accuracy in various applications, and her career continues to inspire future innovations in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile