The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Nov. 19, 2021
Applicant:
Minitab, Llc, State College, PA (US);
Inventors:
Cheryl L. Pammer, San Diego, CA (US);
Robert E. Kelly, State College, PA (US);
Assignee:
Minitab, LLC, State College, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01);
Abstract
Methods and systems to correct low-resolution measurements corresponding to unobservable high-resolution measurements by introducing variation in the plurality of low-resolution measurements through iteratively computing, until a termination criteria is met, perturbed values for the low-resolution measurements. The perturbed values have a higher resolution than another resolution of the low-resolution measurements. A distribution test may afterwards be performed on the perturbed values that remain after the termination criteria is met.