This inventor holds 1 USPTO granted patent. Top assignees: Industry-University Cooperation Foundation Hanyang University, Skhynix Inc.. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 1,232 
1 out of 11,642 
Years Active: 2021
Title: Cheong Il Ryu: Innovator in Thickness Measurement Technology
Introduction
Cheong Il Ryu is a notable inventor based in Hwaseong, South Korea. He has made significant contributions to the field of semiconductor processing through his innovative inventions. His work primarily focuses on developing advanced measurement devices that enhance precision in manufacturing processes.
Latest Patents
Cheong Il Ryu holds a patent for a device and method for measuring thickness. This thickness measuring device utilizes a laser to emit a beam towards an object within a semiconductor processing chamber. The device features a quartz glass that reflects part of the laser beam while transmitting the remainder. It includes two light receiving sensors: the first detects the intensity of the reflected light from the quartz glass, while the second measures the intensity of the light transmitted through the quartz glass and reflected from the object. A controller calculates the input intensity of the laser beam and determines the reflectivity of the object, ultimately measuring its thickness by comparing the calculated reflectivity with predetermined values for various thicknesses. This innovative approach enhances the accuracy of thickness measurements in semiconductor applications.
Career Highlights
Throughout his career, Cheong Il Ryu has worked with prominent companies, including SK Hynix Inc. and the Industry-University Cooperation Foundation at Hanyang University. His experience in these organizations has allowed him to refine his skills and contribute to cutting-edge technology in the semiconductor industry.
Collaborations
Cheong Il Ryu has collaborated with notable colleagues, including Seung Jae Moon and Jung Ho Yun. Their combined expertise has fostered advancements in measurement technologies and semiconductor processing.
Conclusion
Cheong Il Ryu's contributions to thickness measurement technology exemplify his innovative spirit and dedication to enhancing semiconductor manufacturing processes. His patented device represents a significant advancement in precision measurement, showcasing the importance of innovation in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile