This inventor holds 1 USPTO granted patent. Top assignee: Shenzhen Orbbec Co., Ltd.. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: Innovations of Chengyu Zhang in Displacement Measurement Technology.
Introduction
Chengyu Zhang is a notable inventor based in Guangdong, China. He has made significant contributions to the field of measurement technology, particularly in the area of displacement measurement systems. His innovative work has implications for various applications, including aerospace and material characterization.
Latest Patents
Chengyu Zhang holds a patent for an "Overall Z-direction displacement measuring system." This system utilizes laser shearing speckle interferometry to achieve dynamic measurement through a spatial domain phase shift method. The invention enhances measurement accuracy by integrating the principles of Doppler interferometry, allowing for high-precision full-field absolute value vibration measurement and transient depth measurement. This technology is crucial for depth measurement, three-dimensional sensing, and vibration measurement in various fields.
Career Highlights
Chengyu Zhang is currently associated with Shenzhen Orbbec Co., Ltd., where he continues to develop and refine his innovative technologies. His work has positioned him as a key figure in the advancement of measurement systems, contributing to both academic and practical applications.
Collaborations
Chengyu Zhang has collaborated with notable colleagues, including Yuanhao Huang and Honghuai Xu, who have contributed to his research and development efforts. Their teamwork has fostered an environment of innovation and creativity in their projects.
Conclusion
Chengyu Zhang's contributions to displacement measurement technology exemplify the impact of innovative thinking in engineering and science. His patent and ongoing work continue to influence various industries, showcasing the importance of advancements in measurement systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile