The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2019
Filed:
Jan. 17, 2017
Shenzhen Orbbec Co., Ltd., Shenzhen, Guangdong, CN;
Shenzhen Orbbec Co., Ltd., Shenzhen, CN;
Abstract
The present disclosure relates to a full-field Z-direction displacement measurement system. Dynamic measurement is achieved on the basis of laser shearing speckle interferometry by using a spatial domain phase shift method. The homogeneity and similar measurement accuracy of the laser shearing speckle interferometry and the Doppler interferometry are further used to help the laser shearing speckle interferometry to implement absolute displacement measurement by using the single-point time domain Doppler interferometry. By means of the improvements in these aspects, the measurement system of the present invention can achieve full-field Z-direction displacement measurement, high-precision full-field absolute value vibration measurement and transient depth measurement, and can have important applications in depth measurement, three-dimensional sensing, vibration measurement in aerospace and the depth measurement in new material characterization detection and other fields.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile