Cheng-Wei Gu

Title: Cheng-Wei Gu: Innovator in Automated Optical Inspection

Introduction

Cheng-Wei Gu is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of automated optical inspection, showcasing his expertise through innovative patent developments. His work is instrumental in enhancing the efficiency and accuracy of optical inspection systems.

Latest Patents

Cheng-Wei Gu holds a patent for an "Automated optical inspection method, automated optical inspection system and storage medium." This invention provides a comprehensive method for capturing original images of target objects using optical lenses. The process includes edge detection to obtain edge images, followed by calculations of maximum, minimum, and average pixel values. The edge images are divided into blocks, and characteristic values are derived to train a regression model that identifies defects in the target object.

Career Highlights

Cheng-Wei Gu is currently associated with GlobalWafers Co., Ltd., where he applies his innovative skills to develop advanced optical inspection technologies. His work has positioned him as a key player in the semiconductor industry, contributing to the quality assurance processes of various products.

Collaborations

Cheng-Wei collaborates with talented individuals such as Shang-Chi Wang and Chia-Yeh Lee, enhancing the innovative capabilities of his team. Their combined expertise fosters a creative environment that drives technological advancements in their field.

Conclusion

Cheng-Wei Gu's contributions to automated optical inspection reflect his dedication to innovation and excellence. His patent and collaborative efforts continue to influence the industry positively.